N.A, H.; A, S.; A.A, T. Experimental Set Up for Low-angle X-ray Scattering System used for the Characterization of Materials. Malaysian Journal of Science, [S. l.], v. 21, p. 77–81, 2002. Disponível em: https://samudera.um.edu.my/index.php/MJS/article/view/8862. Acesso em: 20 nov. 2024.